"A soft measurement of small out-line transistor in surface mount technology."

Chao Xu et al. (2017)

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DOI: 10.1109/IECON.2017.8217198

access: closed

type: Conference or Workshop Paper

metadata version: 2025-08-19

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Chao Xu, Lifei Bai, Zhihao Zhang, Boxuan Han:
A soft measurement of small out-line transistor in surface mount technology. IECON 2017: 6855-6858

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