"Admittance spectroscopy for planar and across measure configuration of ..."

Andrzej Korcala et al. (2014)

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DOI: 10.1109/ICTON.2014.6876646

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type: Conference or Workshop Paper

metadata version: 2025-07-04

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Andrzej Korcala, Zbigniew Lukasiak, Anna Zawadzka, Przemyslaw Plóciennik, Waclaw Bala, Miroslaw Boniewiez:
Admittance spectroscopy for planar and across measure configuration of metal/porous silicon/Si structures. ICTON 2014: 1-3

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