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"An Improved Technique to Assess AC Performance of a Submicron GaN HEMTs."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Saif-Ur Rehman et al. (2019)

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DOI: 10.1109/ICTC46691.2019.8939850

access: closed

type: Conference or Workshop Paper

metadata version: 2026-02-25

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  dblp key:
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  - https://dblp.org/rec/conf/ictc/RehmanUAAS19
Saif-Ur Rehman, Hafiz Fuad Usman, Umer Farooq Ahmed, M. Asif, Soo Young Shin:
An Improved Technique to Assess AC Performance of a Submicron GaN HEMTs. ICTC 2019: 1104-1109

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