"Improve the Robustness of Diffusive Memristor based True Random Number ..."

Haoyang Li et al. (2022)

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DOI: 10.1109/ICTA56932.2022.9963063

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-16

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Haoyang Li, Yuyang Fu, Tianqing Wan, Yifan Lu, Ling Yang, Yi Li:
Improve the Robustness of Diffusive Memristor based True Random Number Generator via Voltage-to-Time Transformation. ICTA 2022: 58-59

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