"Techniques to Have a Common Understanding of Test Aspects among Test Team ..."

Tomohiro Odan et al. (2020)

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DOI: 10.1109/ICSTW50294.2020.00047

access: closed

type: Conference or Workshop Paper

metadata version: 2020-08-12

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Tomohiro Odan, Shizuka Ban, Hiroki Iseri, Kumiko Iseri, Akiharu Satoh:
Techniques to Have a Common Understanding of Test Aspects among Test Team Members. ICST Workshops 2020: 232-236

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