"A Diagnostic Point of View for the Optimization of Preparation Costs in ..."

Alberto González-Sanchez et al. (2011)

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DOI: 10.1109/ICSTW.2011.21

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Alberto González-Sanchez, Éric Piel, Hans-Gerhard Gross, Arjan J. C. van Gemund:
A Diagnostic Point of View for the Optimization of Preparation Costs in Runtime Testing. ICST Workshops 2011: 654-660

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