"Predicting post-release defects using pre-release field testing results."

Foutse Khomh et al. (2011)

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DOI: 10.1109/ICSM.2011.6080792

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Foutse Khomh, Brian Chan, Ying Zou, Anand Sinha, Dave Dietz:
Predicting post-release defects using pre-release field testing results. ICSM 2011: 253-262

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