"Electroencephalogram Stress Classification of Single Electrode using ..."

Tee Yi Wen et al. (2021)

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DOI: 10.1109/ICSIPA52582.2021.9576794

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-23

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  - conf/icsipa/WenAJU21
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Tee Yi Wen, Siti Armiza Mohd Aris, Siti Zura A. Jalil, Sahnius Bt Usman:
Electroencephalogram Stress Classification of Single Electrode using K-means Clustering and Support Vector Machine. ICSIPA 2021: 77-82

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