"Automated bias-removal resistance measurement circuit for precision ..."

Ciaran Doyle, Daniel Riordan, Joseph Walsh (2015)

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DOI: 10.1109/ICSENST.2015.7438398

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-02

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Ciaran Doyle, Daniel Riordan, Joseph Walsh:
Automated bias-removal resistance measurement circuit for precision on-site temperature calibration exploitation of state changes of materials. ICST 2015: 229-234

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