"Improving wafer map classification in Industry 4.0."

Michael Scheiber et al. (2022)

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DOI: 10.1109/ICPS51978.2022.9816887

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-03

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Michael Scheiber, Clement Nartey, Anja Zernig, Andre Kästner:
Improving wafer map classification in Industry 4.0. ICPS 2022: 1-6

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