"Deep Learning-Based Virtual Metrology in Multivariate Time Series."

Siho Han et al. (2023)

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DOI: 10.1109/ICPHM57936.2023.10194015

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-03

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Siho Han, Jihwan Min, Jui Ma, Gyuil Hwang, Taeyeong Heo, Young Eun Kim, Sungjin Kang, Hyojun Kim, Sangjong Park, Kisuk Sung:
Deep Learning-Based Virtual Metrology in Multivariate Time Series. ICPHM 2023: 30-37

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