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"Empirical Study on BMC Firmware Vulnerabilities: Root Causes and ..."
Jihye Lee, Chanhee Park, Youngjoo Shin (2026)
- Jihye Lee, Chanhee Park, Youngjoo Shin:

Empirical Study on BMC Firmware Vulnerabilities: Root Causes and Architectural Insights. ICOIN 2026: 965-970

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