"Prompt Learner for Industrial Anomaly Detection: Towards Generalizable ..."

Yen-Han Chiang et al. (2025)

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DOI: 10.1109/ICMLA66185.2025.00205

access: closed

type: Conference or Workshop Paper

metadata version: 2026-04-23

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Yen-Han Chiang, Pablo Mollá, Yi-Lun Pan, Yi-Ju Tseng, Vincent S. Tseng:
Prompt Learner for Industrial Anomaly Detection: Towards Generalizable Multimodal Defect. ICMLA 2025: 1338-1345

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