"Characterization, modeling and comparison of 1/f noise in Si/SiGe: C HBTs ..."

Marcelino Seif et al. (2017)

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DOI: 10.1109/ICM.2017.8268847

access: closed

type: Conference or Workshop Paper

metadata version: 2021-03-01

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Marcelino Seif, Fabien Pascal, Bruno Sagnes, J. Elbeyrouthy, Alain Hoffmann, Sébastien Haendler, Pascal Chevalier, Daniel Gloria:
Characterization, modeling and comparison of 1/f noise in Si/SiGe: C HBTs issued from three advanced BiCMOS technologies. ICM 2017: 1-4

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