"Strengthened ESD Reliability of HV nLDMOSs with Embedded Horizontal ..."

Shi-Zhe Hong et al. (2020)

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DOI: 10.1109/ICKII50300.2020.9318957

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-02

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Shi-Zhe Hong, Shen-Li Chen, Sheng-Kai Fan, Po-Lin Lin, Tien-Yu Lan, Yu-Jie Zhou:
Strengthened ESD Reliability of HV nLDMOSs with Embedded Horizontal Schottky Devices. ICKII 2020: 78-79

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