"A novel Bayesian network-based fault prognostic method for semiconductor ..."

Guodong Wang et al. (2017)

> Home

Details and statistics

DOI: 10.1109/ICIT.2017.7915579

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icit2/WangHZG17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icit2/WangHZG17
Guodong Wang, Ramin M. Hasani, Yungang Zhu, Radu Grosu:
A novel Bayesian network-based fault prognostic method for semiconductor manufacturing process. ICIT 2017: 1450-1454

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.