"A Data-Driven Approach for Automated Integrated Circuit Segmentation of ..."

Zifan Yu et al. (2022)

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DOI: 10.1109/ICIP46576.2022.9897544

access: closed

type: Conference or Workshop Paper

metadata version: 2023-02-03

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Zifan Yu, Bruno Machado Trindade, Michael Green, Zhikang Zhang, Pullela Sneha, Erfan Bank Tavakoli, Christopher Pawlowicz, Fengbo Ren:
A Data-Driven Approach for Automated Integrated Circuit Segmentation of Scan Electron Microscopy Images. ICIP 2022: 2851-2855

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