"Similarity-Weighted IoU (sIOU): A Comprehensive Metric for Evaluating ..."

Umamaheswaran Raman Kumar, Patrick Vandewalle (2024)

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DOI: 10.1109/ICIP51287.2024.10647989

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-31

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Umamaheswaran Raman Kumar, Patrick Vandewalle:
Similarity-Weighted IoU (sIOU): A Comprehensive Metric for Evaluating Model Performance Through Similarity-Weighted Class Overlaps. ICIP 2024: 936-942

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