"Cost-Effective High-Speed DRAM Testing: Circuit-Level Enhancements with ..."

Kyungjun Lee, Juyeob Lee, Eunil Park (2025)

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DOI: 10.1109/ICICDT65192.2025.11078066

access: closed

type: Conference or Workshop Paper

metadata version: 2025-07-31

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Kyungjun Lee, Juyeob Lee, Eunil Park:
Cost-Effective High-Speed DRAM Testing: Circuit-Level Enhancements with Clock Multiplication and ECC. ICICDT 2025: 49-52

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