"Efficient test Generation for Register Transfer Level Descriptions."

Ioannis Stamelos, C. Halatsis (1987)

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DOI: 10.1007/978-3-642-45628-2_13

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Ioannis Stamelos, C. Halatsis:
Efficient test Generation for Register Transfer Level Descriptions. Fehlertolerierende Rechensysteme 1987: 141-152

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