"Impact analysis of stochastic transistor aging on current-steering DACs in ..."

Simon Vanden Bussche et al. (2011)

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DOI: 10.1109/ICECS.2011.6122239

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

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  - conf/icecsys/BusscheWMG11
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Simon Vanden Bussche, Pieter De Wit, Elie Maricau, Georges G. E. Gielen:
Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS. ICECS 2011: 161-164

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