"Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine ..."

Wang WeiQuan, Riaz-Ul-Haque Mian (2025)

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DOI: 10.1109/ICECET63943.2025.11472447

access: closed

type: Conference or Workshop Paper

metadata version: 2026-04-21

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Wang WeiQuan, Riaz-Ul-Haque Mian:
Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning. ICECET 2025: 1-6

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