"Reliability Study of Strained Silicon SOI TFET."

Urmila Bag et al. (2025)

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DOI: 10.1109/ICECET63943.2025.11472429

access: closed

type: Conference or Workshop Paper

metadata version: 2026-04-20

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Urmila Bag, Brinda Bhowmick, Rajesh Saha, Puspa Devi Pukhrambam:
Reliability Study of Strained Silicon SOI TFET. ICECET 2025: 1-6

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