"Parallel Testing Method by Partitioning Circuit Based on the Exhaustive Test."

Wu Woan Kim (2004)

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DOI: 10.1007/978-3-540-24709-8_28

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Wu Woan Kim:
Parallel Testing Method by Partitioning Circuit Based on the Exhaustive Test. ICCSA (2) 2004: 262-271

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