"Defect Detection on Wafer Map Using Efficient Convolutional Neural Network."

Chieng-Yang Wang, Tsung-Han Tsai (2021)

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DOI: 10.1109/ICCE-TW52618.2021.9603145

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-06

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Chieng-Yang Wang, Tsung-Han Tsai:
Defect Detection on Wafer Map Using Efficient Convolutional Neural Network. ICCE-TW 2021: 1-2

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