"Design on ESD robustness of source-side discrete distribution in the 60-V ..."

Shen-Li Chen et al. (2016)

> Home

Details and statistics

DOI: 10.1109/ICCE-TW.2016.7521041

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-29

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icce-tw/ChenYYCWL16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icce-tw/ChenYYCWL16
Shen-Li Chen, Chih-Hung Yang, Chih-Ying Yen, Kuei-Jyun Chen, Yi-Cih Wu, Jia-Ming Lin:
Design on ESD robustness of source-side discrete distribution in the 60-V high-voltage nLDMOS devices. ICCE-TW 2016: 1-2

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.