"A New Class of Sequential Circuits with Acyclic Test Generation Complexity."

Chia Yee Ooi, Hideo Fujiwara (2006)

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DOI: 10.1109/ICCD.2006.4380851

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Chia Yee Ooi, Hideo Fujiwara:
A New Class of Sequential Circuits with Acyclic Test Generation Complexity. ICCD 2006: 425-431

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