"Sneak path testing and fault modeling for multilevel memristor-based memories."

Sachhidh Kannan, Ramesh Karri, Ozgur Sinanoglu (2013)

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DOI: 10.1109/ICCD.2013.6657045

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Sachhidh Kannan, Ramesh Karri, Ozgur Sinanoglu:
Sneak path testing and fault modeling for multilevel memristor-based memories. ICCD 2013: 215-220

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