"Efficient testability enhancement for combinational circuit."

Yu Fang, Alexander Albicki (1995)

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DOI: 10.1109/ICCD.1995.528806

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yu Fang, Alexander Albicki:
Efficient testability enhancement for combinational circuit. ICCD 1995: 168-179

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