"Characterization for Sub-5nm Technology Nodes of Junctionless ..."

Aruru Sai Kumar et al. (2022)

> Home

Details and statistics

DOI: 10.1109/ICCCNT54827.2022.9984269

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icccnt/KumarDSSS22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icccnt/KumarDSSS22
Aruru Sai Kumar, M. Deekshana, V. Bharath Sreenivasulu, Rajendra Prasad Somineni, D. Kanthi Sudha:
Characterization for Sub-5nm Technology Nodes of Junctionless Gate-All-Around Nanowire FETs. ICCCNT 2022: 1-5

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.