"Voltage-based electromigration immortality check for general multi-branch ..."

Zeyu Sun et al. (2016)

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DOI: 10.1145/2966986.2967083

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-19

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Zeyu Sun, Ertugrul Demircan, Mehul D. Shroff, Taeyoung Kim, Xin Huang, Sheldon X.-D. Tan:
Voltage-based electromigration immortality check for general multi-branch interconnects. ICCAD 2016: 113

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