"High Sensitive ECT Probe for Detection of Deeply Buried Defects."

Lian Xie et al. (2025)

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DOI: 10.1109/I2MTC62753.2025.11079107

access: closed

type: Conference or Workshop Paper

metadata version: 2026-04-12

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Lian Xie, Prashanth Baskaran, Artur Lopes Ribeiro, Francisco André Corrêa Alegria, Bo Feng, Helena Maria Geirinhas Ramos:
High Sensitive ECT Probe for Detection of Deeply Buried Defects. I2MTC 2025: 1-6

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