"Measurement technique for characterizing constitutive material properties ..."

Anjali Sharma, Mohammed N. Afsar (2013)

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DOI: 10.1109/I2MTC.2013.6555616

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-23

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Anjali Sharma, Mohammed N. Afsar:
Measurement technique for characterizing constitutive material properties of thin films. I2MTC 2013: 1261-1265

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