"Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement ..."

Mathias Poik et al. (2022)

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DOI: 10.1109/I2MTC48687.2022.9806639

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type: Conference or Workshop Paper

metadata version: 2022-10-02

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Mathias Poik, Mario Mayr, Thomas Hackl, Georg Schitter:
Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement Modes. I2MTC 2022: 1-6

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