"Measurement accuracy and repeatability in near-field scanning microwave ..."

Sijia Gu et al. (2015)

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DOI: 10.1109/I2MTC.2015.7151542

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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Sijia Gu, Kamel Haddadi, Abdelhatif El Fellahi, Gilles Dambrine, Tuami Lasri:
Measurement accuracy and repeatability in near-field scanning microwave microscopy. I2MTC 2015: 1735-1740

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