"Automatic measurement system for the DC and low-f noise characterization ..."

Gino Giusi et al. (2015)

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DOI: 10.1109/I2MTC.2015.7151606

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Gino Giusi, Orazio Giordano, Graziella Scandurra, Carmine Ciofi, Matteo Rapisarda, Sabrina Calvi:
Automatic measurement system for the DC and low-f noise characterization of FETs at wafer level. I2MTC 2015: 2095-2100

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