"Wideband measurement method for prognosis of soldering failure on ..."

Francesco Adamo et al. (2014)

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DOI: 10.1109/I2MTC.2014.6860831

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Francesco Adamo, Gregorio Andria, Attilio Di Nisio, Nicola Giaquinto, Valeria L. Scarano, Maurizio Spadavecchia:
Wideband measurement method for prognosis of soldering failure on electronic boards. I2MTC 2014: 693-696

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