"A Reliability-Aware Topology-Agnostic Test Scheme for Detecting, and ..."

Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka (2016)

> Home

Details and statistics

DOI: 10.1109/HPCC-SMARTCITY-DSS.2016.0081

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/hpcc/BhowmikBD16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/hpcc/BhowmikBD16
Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka:
A Reliability-Aware Topology-Agnostic Test Scheme for Detecting, and Diagnosing Interconnect Shorts in On-chip Networks. HPCC/SmartCity/DSS 2016: 530-537

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.