"Exploration of LLM Workload Reliability Based on di/dt Effects and Voltage ..."

Zhixing Jiang et al. (2026)

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DOI: 10.1109/HPCA68181.2026.11408597

access: closed

type: Conference or Workshop Paper

metadata version: 2026-03-25

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Zhixing Jiang, Justin Garrigus, Allison Seigler, Ethan Syed, Yan-Lun Huang, Mehdi Sadi, Tawfik Rahal-Arabi, Lizy Kurian John:
Exploration of LLM Workload Reliability Based on di/dt Effects and Voltage Droops. HPCA 2026: 1-15

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