"Toward Scalable Gate-Level Parallelism on Trapped-Ion Processors with ..."

Enhyeok Jang et al. (2026)

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DOI: 10.1109/HPCA68181.2026.11408608

access: closed

type: Conference or Workshop Paper

metadata version: 2026-03-26

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Enhyeok Jang, Hyungseok Kim, Yongju Lee, Jaewon Kwon, Yipeng Huang, Won Woo Ro:
Toward Scalable Gate-Level Parallelism on Trapped-Ion Processors with Racetrack Electrodes. HPCA 2026: 1-17

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