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"Effectiveness of Random Testing of Embedded Systems."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Padmanabhan Krishnan et al. (2012)

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DOI: 10.1109/HICSS.2012.233

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/hicss/KrishnanVBMS12
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  persistent URL:
  - https://dblp.org/rec/conf/hicss/KrishnanVBMS12
Padmanabhan Krishnan, R. Venkatesh, Prasad Bokil, Tukaram Muske, P. Vijay Suman:
Effectiveness of Random Testing of Embedded Systems. HICSS 2012: 5556-5563

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