"Automated Security Analysis for Real-World IoT Devices."

Lélio Brun et al. (2023)

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DOI: 10.1145/3623652.3623667

access: open

type: Conference or Workshop Paper

metadata version: 2026-02-19

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Lélio Brun, Ichiro Hasuo, Yasushi Ono, Taro Sekiyama:
Automated Security Analysis for Real-World IoT Devices. HASP@MICRO 2023: 29-37

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