"Deep BIAS: Detecting Structural Bias using Explainable AI."

Bas van Stein et al. (2023)

> Home

Details and statistics

DOI: 10.1145/3583133.3590551

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-05

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/gecco/SteinVCK23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/gecco/SteinVCK23
Bas van Stein, Diederick Vermetten, Fabio Caraffini, Anna V. Kononova:
Deep BIAS: Detecting Structural Bias using Explainable AI. GECCO Companion 2023: 455-458

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.