"Corrugated Cardboard Defect Detection Based on Attention Mechanism and ..."

Yali Zhang et al. (2024)

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DOI: 10.3233/FAIA241449

access: closed

type: Conference or Workshop Paper

metadata version: 2025-02-14

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Yali Zhang, Fang Xu, You Liu, Guowei Zhang, Tongshan Liu, Dan Yan:
Corrugated Cardboard Defect Detection Based on Attention Mechanism and Lightweight Improvements in YOLOv8. FSDM 2024: 475-484

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