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"Investigation on Gate Capacitances Fluctuation Due to Work-Function ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Wei-feng Lü, Mi Lin, Haipeng Zhang (2017)

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DOI: 10.3233/978-1-61499-828-0-398

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-15

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  dblp key:
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Wei-feng Lü, Mi Lin, Haipeng Zhang:
Investigation on Gate Capacitances Fluctuation Due to Work-Function Variation in Metal-Gate FinFETs. FSDM 2017: 398-403

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