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"Impact of Ferroelectric Layer Thickness on Negative Capacitance Mosfets."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Wei-feng Lü et al. (2018)

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DOI: 10.3233/978-1-61499-927-0-898

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-15

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  dblp key:
  - conf/fsdm/LuDLZ18
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  persistent URL:
  - https://dblp.org/rec/conf/fsdm/LuDLZ18
Wei-feng Lü, Liang Dai, Mi Lin, Haipeng Zhang:
Impact of Ferroelectric Layer Thickness on Negative Capacitance Mosfets. FSDM 2018: 898-903

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