"Improving IoT Module Testability with Test-Driven Development and Machine ..."

Victor Takashi Hayashi et al. (2021)

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DOI: 10.1109/FICLOUD49777.2021.00066

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-15

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Victor Takashi Hayashi, Cairo Mateus Neves Ribeiro, Artino Quintino Filho, Matheus Ancelmo Bonfim Pita, Bruno Manias Trazzi, Júlio Cezar Estrella, Wilson Vicente Ruggiero:
Improving IoT Module Testability with Test-Driven Development and Machine Learning. FiCloud 2021: 406-412

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