"F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard ..."

Marie Engelene J. Obien, Satoshi Ohtake, Hideo Fujiwara (2011)

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DOI: 10.1109/ETS.2011.61

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Marie Engelene J. Obien, Satoshi Ohtake, Hideo Fujiwara:
F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG. ETS 2011: 203

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