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"Transistor stuck-on fault detection tests for digital CMOS circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Xijiang Lin, Sudhakar M. Reddy, Janusz Rajski (2016)

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DOI: 10.1109/ETS.2016.7519329

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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Xijiang Lin, Sudhakar M. Reddy, Janusz Rajski:
Transistor stuck-on fault detection tests for digital CMOS circuits. ETS 2016: 1-6

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