"Variance Reduction for Supply Ramp Based Cheap RF Test Alternatives."

Shaji Krishnan, Rene Jonker, Leon van de Logt (2007)

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DOI: 10.1109/ETS.2007.44

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Shaji Krishnan, Rene Jonker, Leon van de Logt:
Variance Reduction for Supply Ramp Based Cheap RF Test Alternatives. ETS 2007: 55-62

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